What are the Common Techniques for Precision Measurement?
Several advanced techniques are employed to achieve high precision in nanotechnology:
Atomic Force Microscopy (AFM): This technique uses a cantilever with a sharp tip to scan the surface of a sample, providing high-resolution images at the atomic level. Scanning Electron Microscopy (SEM): SEM uses a focused beam of electrons to produce detailed images of the sample surface, enabling the study of surface topography and composition. Transmission Electron Microscopy (TEM): TEM transmits a beam of electrons through a thin sample, generating high-resolution images and providing information about the internal structure of nanomaterials. X-ray Diffraction (XRD): XRD is used to determine the crystalline structure of materials by analyzing the pattern of X-rays diffracted through the sample. Raman Spectroscopy: This technique measures the vibrations of molecules in the sample, offering insights into chemical composition and molecular interactions.
