What are the Common Techniques for High Resolution Imaging?
Several techniques are widely used for high resolution imaging in nanotechnology:
Transmission Electron Microscopy (TEM): TEM uses a beam of electrons to transmit through a sample, providing high-resolution images of internal structures at the atomic scale. Scanning Electron Microscopy (SEM): SEM scans the surface of a sample with a focused beam of electrons, offering detailed images of surface topography and composition. Atomic Force Microscopy (AFM): AFM employs a sharp tip to scan the surface of a sample, providing three-dimensional images and information about surface roughness and mechanical properties. Scanning Tunneling Microscopy (STM): STM uses a sharp conducting tip to tunnel electrons between the tip and the sample, allowing for atomic-scale imaging of conductive surfaces.
