Advancements in high resolution imaging are continuously being made to address the challenges and improve the capabilities of these techniques:
Aberration Correction: Aberration-corrected TEM and SEM have significantly improved the resolution and image quality by correcting for lens imperfections. Environmental SEM: Environmental SEM allows for imaging samples in their natural state, without the need for extensive sample preparation. Advanced Detectors: The development of advanced detectors has enhanced the sensitivity and speed of imaging, enabling real-time observations at the nanoscale. Multimodal Imaging: Combining various imaging techniques (e.g., TEM with AFM) provides complementary information and a more comprehensive understanding of nanomaterials.
