What are the Challenges in FET Measurements at the Nanoscale?
Some of the main challenges include:
Contact Resistance: Ensuring low-resistance and reliable electrical contacts can be difficult at the nanoscale. Measurement Noise: Minimizing electrical noise that can obscure accurate readings. Device Variability: Nanoscale devices can exhibit significant variability due to minute differences in fabrication. Environmental Sensitivity: Nanoscale FETs can be highly sensitive to environmental factors such as humidity and temperature.
