Various techniques are employed to collect data in nanotechnology. These include:
1. Atomic Force Microscopy (AFM): This technique helps in visualizing surfaces at the nanoscale. 2. Scanning Electron Microscopy (SEM): SEM provides high-resolution images of nanostructures. 3. Transmission Electron Microscopy (TEM): TEM is used for observing the internal structure of nanoparticles. 4. X-ray Diffraction (XRD): XRD identifies crystalline structures and particle sizes. 5. Spectroscopy Techniques: Various forms of spectroscopy, such as Raman Spectroscopy, are used for material characterization.
