NSOM offers several advantages over traditional optical microscopy methods: - High Resolution: It can achieve spatial resolutions beyond the diffraction limit, often down to 20-50 nanometers. - Non-Destructive: Unlike electron microscopy, NSOM does not require extensive sample preparation, making it less likely to alter or damage the sample. - Versatility: It can be used in various environments, including air, liquid, and vacuum, and is compatible with a wide range of materials. - Multi-Modal Capabilities: NSOM can be combined with other techniques, such as atomic force microscopy (AFM), to provide complementary information about the sample.
