physical sciences

What Are Some Techniques for Characterizing Nanomaterials?


Characterization of nanomaterials involves a variety of techniques to understand their properties and behavior. Common methods include Transmission Electron Microscopy (TEM), which provides high-resolution images, and Scanning Electron Microscopy (SEM), which offers detailed surface topography. Atomic Force Microscopy (AFM) is used to measure surface forces, while X-ray Diffraction (XRD) helps in determining crystalline structures.

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