Several techniques are used to measure and evaluate coating uniformity:
Scanning Electron Microscopy (SEM): Provides high-resolution images to assess the surface morphology and uniformity. Atomic Force Microscopy (AFM): Measures surface roughness and topography at the nanoscale. Ellipsometry: An optical technique that measures the thickness and uniformity of thin films. X-ray Reflectivity (XRR): Determines film thickness and density with high precision.
