Characterizing prepared samples is crucial for understanding their properties and behavior. Techniques include: - Electron Microscopy (SEM, TEM): Provides detailed images of nanoparticle morphology and structure. - X-ray Diffraction (XRD): Determines the crystalline structure of nanoparticles. - Dynamic Light Scattering (DLS): Measures particle size distribution in suspension. - Atomic Force Microscopy (AFM): Offers high-resolution topographical imaging of surfaces.
