quantitative data

How is Quantitative Data Collected?

Quantitative data in nanotechnology is typically collected using advanced instrumentation and techniques. Some common methods include:
- Scanning Electron Microscopy (SEM) for imaging and measuring nanoscale features.
- Atomic Force Microscopy (AFM) for surface topography and mechanical properties.
- Dynamic Light Scattering (DLS) for particle size distribution.
- X-ray Diffraction (XRD) for crystallographic information.
- Spectroscopy techniques like UV-Vis, FTIR, and Raman for chemical composition.

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