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How is Graphene Characterized?

Characterizing graphene involves various techniques to understand its structure, properties, and quality. Some common methods include:
- Raman Spectroscopy: Used to identify the number of layers and defects in graphene.
- Scanning Electron Microscopy (SEM): Provides detailed images of graphene’s surface morphology.
- Atomic Force Microscopy (AFM): Measures the thickness and surface roughness of graphene layers.
- X-ray Photoelectron Spectroscopy (XPS): Analyzes the chemical composition and electronic state of graphene.
Understanding these characteristics is crucial for tailoring graphene for specific applications in nanotechnology.

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