Electron microscopes use a beam of electrons, which have much shorter wavelengths than light photons. This enables the microscope to resolve features at the nanometer scale. The primary types of electron microscopes are the Transmission Electron Microscope (TEM) and the Scanning Electron Microscope (SEM). In TEM, electrons pass through the specimen to form an image, while in SEM, electrons are reflected off the surface to create detailed topographical images.
