How does a Transmission Electron Microscope (TEM) differ from an SEM?
While both TEM and SEM use electron beams for imaging, TEMs transmit electrons through a very thin sample, allowing for the observation of internal structures at atomic resolution. TEMs are crucial for studying the internal composition, crystallography, and defects within materials. In contrast, SEMs provide detailed surface topographies. TEMs require more complex sample preparation compared to SEMs.
