How do current instruments fare against these challenges?
Despite these challenges, current instruments have made significant strides:
1. Atomic Force Microscopy (AFM): AFM offers high-resolution imaging and can operate in various environments, but it can be slow and often requires meticulous sample preparation. 2. Electron Microscopes: SEM and TEM provide excellent resolution but are expensive and require extensive training to operate. 3. Scanning Tunneling Microscopy (STM): STM can visualize and manipulate individual atoms, but it requires ultra-high vacuum conditions and low temperatures.
