physical tampering

How Can Physical Tampering be Detected?

Detecting physical tampering in nanotechnology involves employing advanced analytical techniques such as Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), and X-ray diffraction. These techniques can reveal alterations at the nanoscale, enabling the identification of any unauthorized modifications. Additionally, real-time monitoring systems and integrated sensors can provide alerts when tampering is detected.

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