How are Scanning Probe Microscopes (SPMs) advancing Nanotechnology research?
Scanning Probe Microscopes (SPMs), including Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM), have revolutionized the field. These tools allow researchers to visualize and manipulate individual atoms and molecules with unprecedented precision. AFM, for instance, is widely used to measure surface roughness and mechanical properties at the nanoscale.
