Descriptors are typically measured using a variety of analytical techniques. Some common methods include:
Electron Microscopy (TEM, SEM): Used for measuring size, shape, and structure. X-ray Diffraction (XRD): Used for determining crystal structure and phase composition. Spectroscopy (FTIR, UV-Vis, NMR): Used for analyzing chemical composition and surface chemistry. Dynamic Light Scattering (DLS): Used for measuring particle size distribution. Zeta Potential Analysis: Used for assessing surface charge and stability in suspension.
