What is Subthreshold Leakage?
Subthreshold leakage, also known as subthreshold conduction, refers to the small amount of current that leaks through a transistor even when it is supposed to be in the off state. This phenomenon occurs when the gate voltage is below the threshold voltage of the transistor. In the context of
nanotechnology, this leakage becomes more pronounced due to the reduced dimensions and enhanced electric fields in nanoscale devices.
How is Subthreshold Leakage Measured?
Subthreshold leakage is measured as the current flowing through the transistor when the gate voltage is less than the
threshold voltage. This is typically represented as Ioff, which stands for the off-state current. The
leakage current is heavily influenced by factors such as the threshold voltage, channel length, and temperature.
Threshold Voltage: Lower threshold voltages increase subthreshold leakage.
Channel Length: Shorter channel lengths lead to higher leakage currents.
Doping Concentration: Higher doping levels can reduce leakage but may affect other device characteristics.
Temperature: Higher temperatures generally increase leakage currents.
Conclusion
Subthreshold leakage is a critical issue in nanotechnology, affecting the performance, power efficiency, and thermal management of nanoscale devices. Understanding the factors that influence leakage and implementing effective mitigation strategies are essential for the advancement of future electronic technologies.