In nanotechnology, the ability to visualize and measure structures at the nanoscale is crucial. Conventional microscopes are limited by the diffraction limit, which restricts the smallest detail that can be resolved to about 200 nanometers. SIM breaks this barrier, allowing for the visualization of structures as small as 100 nanometers. This enhanced resolution is vital for the development and study of nanostructures, nanomaterials, and nanodevices.
