Resolution is critical because it determines the smallest feature size that can be observed or manipulated. In nanotechnology, achieving atomic-scale resolution is essential. However, many conventional instruments, like optical microscopes, are limited by the diffraction limit of light, making them unsuitable for nanoscopic measurements. Advanced tools like scanning tunneling microscopes (STMs) and atomic force microscopes (AFMs) offer higher resolution but come with their own set of complexities and limitations.
