Are there limitations specific to certain types of nanotechnology instruments?
Yes, different instruments face unique limitations. For example, electron microscopes offer excellent resolution but require vacuum conditions and can damage samples with high-energy electron beams. Scanning probe microscopes, such as AFMs, provide high-resolution surface imaging but are limited in speed and often face difficulties with soft or sticky samples. Spectroscopic techniques offer valuable chemical information but can be limited in spatial resolution and sensitivity.
