physical descriptors

What Tools are Used for Characterizing Physical Descriptors?

A variety of advanced techniques are employed to measure and analyze the physical descriptors of nanomaterials. Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) are used for size and shape analysis. Atomic force microscopy (AFM) provides topographical details. X-ray diffraction (XRD) elucidates crystal structures, while dynamic light scattering (DLS) measures particle size distribution and zeta potential.

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