What Tools and Techniques Are Used for Characterization?
Characterization tools and techniques are essential for understanding the properties of nanomaterials. Some of the most common methods include: - Scanning Electron Microscopy (SEM): Provides high-resolution images to study surface morphology. - Transmission Electron Microscopy (TEM): Offers detailed internal structure analysis. - Atomic Force Microscopy (AFM): Measures surface roughness and topography. - X-ray Diffraction (XRD): Determines the crystalline structure. - Dynamic Light Scattering (DLS): Measures particle size distribution. - Fourier Transform Infrared Spectroscopy (FTIR): Identifies chemical bonds and molecular composition.
