Several techniques rely on specific wavelengths to probe nanomaterials:
Atomic Force Microscopy (AFM): Uses near-infrared or visible light lasers for cantilever detection, providing high-resolution topographical images. Scanning Electron Microscopy (SEM): Utilizes electron beams with very short wavelengths, allowing for high-resolution imaging of nanoscale structures. Raman Spectroscopy: Employs visible to near-infrared light to detect vibrational modes in molecules, offering information about molecular composition and structure. X-ray Diffraction (XRD): Uses X-rays to investigate the atomic structure of crystalline materials, providing insights into lattice parameters and defect structures.
