What Techniques are Used to Study the Reflected Spectrum?
Various techniques are employed to analyze the reflected spectrum of nanomaterials:
Reflectance Spectroscopy: This technique measures the intensity of reflected light as a function of wavelength. It is commonly used to characterize thin films and surface coatings. Scanning Electron Microscopy (SEM): SEM can provide detailed images of nanostructures, allowing researchers to correlate the physical structure with the reflected spectrum. Atomic Force Microscopy (AFM): AFM offers high-resolution topographical maps of nanomaterials, aiding in the understanding of their optical properties.
