What Techniques are Used to Measure Surface Roughness?
Several techniques are employed to measure surface roughness, each with its own advantages and limitations:
Atomic Force Microscopy (AFM): AFM is one of the most widely used techniques for measuring surface roughness at the nanoscale. It provides high-resolution 3D images of the surface. Scanning Electron Microscopy (SEM): While SEM offers high-resolution images, it is often used in conjunction with other techniques to quantify surface roughness. Optical Profilometry: This non-contact method uses light to measure surface roughness. It is suitable for large area measurements but has lower resolution compared to AFM. Stylus Profilometry: In this method, a stylus physically touches the surface to measure its roughness. It is less suitable for delicate or soft surfaces.
