What Techniques are Used to Characterize Vacancies?
Several advanced techniques are employed to characterize vacancies in nanomaterials. These include Transmission Electron Microscopy (TEM), Scanning Tunneling Microscopy (STM), and X-ray Diffraction (XRD). Each technique offers unique insights into the structure and distribution of vacancies. TEM, for instance, provides high-resolution images that can reveal the presence of vacancies, while STM allows for the examination of surface vacancies at the atomic level.
