What Techniques are Used in Nanoscale Semiconductor Analysis?
Several advanced techniques are used for semiconductor analysis at the nanoscale:
Scanning Electron Microscopy (SEM) - Provides high-resolution images by scanning a sample with a focused beam of electrons. Transmission Electron Microscopy (TEM) - Offers detailed internal structure images by transmitting electrons through a thin sample. Atomic Force Microscopy (AFM) - Measures surface topography at the nanoscale by scanning a probe over the sample. X-ray Diffraction (XRD) - Determines crystal structures and composition by analyzing the diffraction pattern of X-rays passing through the sample. Raman Spectroscopy - Provides information about molecular vibrations and material composition using inelastic scattering of light.
