Several advanced techniques are employed to generate topographic maps at the nanoscale, including:
- Atomic Force Microscopy (AFM): This technique uses a sharp probe to scan the surface, providing high-resolution topographic images. - Scanning Tunneling Microscopy (STM): STM measures the tunneling current between the probe and the surface to produce atomic-scale images. - Scanning Electron Microscopy (SEM): SEM uses a focused electron beam to generate detailed surface images, often combined with other methods for enhanced resolution.
