Several advanced techniques are employed for surface sampling in nanotechnology:
1. Atomic Force Microscopy (AFM): AFM involves a mechanical probe that scans the surface, providing topographical maps at the nanometer scale. It can be used to measure forces and mechanical properties. 2. Scanning Electron Microscopy (SEM): SEM uses focused beams of electrons to produce high-resolution images of the surface. It is useful for analyzing surface morphology and composition. 3. X-ray Photoelectron Spectroscopy (XPS): XPS measures the elemental composition of the surface by detecting the energy of photoelectrons emitted after X-ray irradiation. 4. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): ToF-SIMS analyzes the composition of surface layers by sputtering the surface with a focused ion beam and measuring the ejected secondary ions.
