semiconductor inspection

What Techniques are Used for Semiconductor Inspection?

Several techniques are utilized to inspect semiconductors at the nanoscale level:
Scanning Electron Microscopy (SEM): Provides high-resolution images to detect surface defects.
Atomic Force Microscopy (AFM): Offers three-dimensional surface profiling to identify topographical inconsistencies.
Transmission Electron Microscopy (TEM): Enables the observation of internal structures at atomic resolution.
X-ray Diffraction (XRD): Used for analyzing crystal structures and identifying material phases.
Optical Microscopy: Employs visible light for basic inspections but is limited in resolution compared to other methods.

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