What Techniques are Used for Particle Characterization?
Several advanced techniques are employed for particle characterization, each suited to measure different properties:
1. Dynamic Light Scattering (DLS): Used for measuring particle size and size distribution. 2. Scanning Electron Microscopy (SEM): Provides high-resolution images to analyze particle shape and surface morphology. 3. Transmission Electron Microscopy (TEM): Offers detailed internal structure and particle size information. 4. Atomic Force Microscopy (AFM): Used for topographical mapping and measuring the surface roughness of nanoparticles. 5. X-ray Diffraction (XRD): Determines the crystal structure and phase composition. 6. Fourier Transform Infrared Spectroscopy (FTIR): Identifies chemical bonds and functional groups. 7. Zeta Potential Analysis: Measures the zeta potential to understand particle stability in colloidal systems.
