measurement problem

What Techniques are Used for Nanoscale Measurement?

Several advanced techniques are employed for measuring at the nanoscale:
Atomic Force Microscopy (AFM): Measures surface topography by scanning a sharp tip over the surface.
Scanning Electron Microscopy (SEM): Uses focused beams of electrons to produce high-resolution images.
Transmission Electron Microscopy (TEM): Transmits electrons through a sample to study internal structure.
X-ray Diffraction (XRD): Analyzes crystal structures by observing the pattern of X-ray scattering.
Dynamic Light Scattering (DLS): Measures the size distribution of particles in a solution by analyzing the scattering of laser light.

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