How is the Thermal Expansion Coefficient Measured for Nanomaterials?
Measuring the TEC at the nanoscale can be challenging due to the small size of the materials. Techniques such as X-ray diffraction (XRD), transmission electron microscopy (TEM), and atomic force microscopy (AFM) are often employed. These methods allow for high precision and spatial resolution, enabling accurate determination of TEC in nanostructures.
