What Techniques are Used for Multi-Element Detection?
Several advanced techniques are employed for multi-element detection in nanotechnology. Some of the most commonly used methods include:
Inductively Coupled Plasma Mass Spectrometry (ICP-MS): Known for its high sensitivity and ability to detect trace elements, ICP-MS is widely used for analyzing the elemental composition of nanoparticles. X-ray Fluorescence Spectroscopy (XRF): This non-destructive technique is used to determine the elemental composition of materials by measuring the characteristic X-rays emitted from a sample. Energy Dispersive X-ray Spectroscopy (EDS): Often coupled with Scanning Electron Microscopy (SEM), EDS provides qualitative and quantitative elemental analysis of nanomaterials. Secondary Ion Mass Spectrometry (SIMS): SIMS offers high spatial resolution and is useful for depth profiling in multilayered nanostructures.
