What Techniques are Used for Characterizing Nanomaterials?
Several sophisticated techniques are used for characterizing nanomaterials, each providing unique information about their properties. Some of the most commonly used techniques include:
- Transmission Electron Microscopy (TEM): TEM provides high-resolution images of nanomaterials, allowing scientists to observe their internal structure and morphology at the atomic level. - Scanning Electron Microscopy (SEM): SEM offers detailed surface images, which help in understanding the surface morphology and topography of nanomaterials. - Atomic Force Microscopy (AFM): AFM measures the surface roughness and mechanical properties by scanning the surface with a fine tip. - X-ray Diffraction (XRD): XRD is used to determine the crystalline structure and phase composition of nanomaterials. - Dynamic Light Scattering (DLS): DLS measures the size distribution of nanoparticles in a suspension by analyzing the scattering of light.
