advanced analysis

What Techniques are Commonly Used?

Several advanced techniques are commonly used for nanomaterial analysis, including:
1. Scanning Electron Microscopy (SEM): This technique provides high-resolution images of the surface morphology of nanomaterials.
2. Transmission Electron Microscopy (TEM): TEM offers detailed internal structure imaging at atomic resolution.
3. Atomic Force Microscopy (AFM): AFM is used to measure surface topography and mechanical properties at the nanoscale.
4. X-ray Diffraction (XRD): XRD is employed to determine the crystalline structure and phase composition of nanomaterials.
5. Spectroscopy: Various spectroscopic techniques, such as Raman and FTIR, are used to analyze the chemical composition and molecular interactions in nanomaterials.

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