Several characterization techniques are commonly integrated to study nanomaterials. These include:
Scanning Electron Microscopy (SEM)
SEM is used to examine the surface morphology of nanomaterials. It provides high-resolution images that reveal structural details at the nanoscale.
Transmission Electron Microscopy (TEM)
TEM offers even higher resolution than SEM and can provide information about the internal structure of nanomaterials. It is particularly useful for studying the crystallographic structure and defects within nanoparticles.
Atomic Force Microscopy (AFM)
AFM provides topographical data by scanning a probe over the surface of the material. It can also measure mechanical properties like stiffness and adhesion at the nanoscale.
X-ray Diffraction (XRD)
XRD is used to determine the crystalline structure of nanomaterials. It provides information about the size, shape, and orientation of crystals, which is essential for understanding material properties.
Energy Dispersive X-ray Spectroscopy (EDS)
Often integrated with SEM or TEM, EDS is used for elemental analysis. It helps in identifying the chemical composition of nanomaterials.
Dynamic Light Scattering (DLS)
DLS is employed to measure the size distribution of nanoparticles in a solution. It is a crucial technique for understanding the colloidal stability of nanomaterials.
