Integration of these techniques can be achieved through various approaches:
Sequential Analysis In this approach, a sample is analyzed using different techniques one after the other. For example, a nanomaterial could be first examined using SEM for surface morphology, followed by TEM for internal structure, and then EDS for chemical composition.
Simultaneous Analysis Some advanced instruments allow for simultaneous analysis using multiple techniques. For instance, a TEM equipped with EDS can provide both structural and compositional information concurrently.
Correlative Microscopy This method involves correlating data from different microscopy techniques to provide a more comprehensive understanding. For example, AFM data can be correlated with SEM images to understand the relationship between surface topography and structural details.
