Several sophisticated techniques are employed for monitoring nanomaterials, including:
Electron Microscopy: Provides high-resolution images to study the structure and morphology of nanomaterials. Spectroscopy: Techniques like X-ray diffraction (XRD) and UV-Vis spectroscopy are used for compositional analysis. Atomic Force Microscopy (AFM): Offers three-dimensional surface profiles at the nanoscale. Dynamic Light Scattering (DLS): Measures particle size distribution and zeta potential.
