spectroscopic reflectometry

What is Spectroscopic Reflectometry?

Spectroscopic reflectometry is an analytical technique used to measure the thickness and optical properties of thin films. By analyzing the reflected light spectrum from a sample, this technique provides valuable information about the material's composition, thickness, and refractive index. In the context of Nanotechnology, spectroscopic reflectometry is particularly significant for characterizing nanoscale films and coatings.

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