Field Ion Microscopy (FIM) is a powerful imaging technique that allows scientists to visualize individual atoms on the surface of a material. It was first developed by Erwin Müller in 1951 and has since become a crucial tool in nanotechnology for analyzing the atomic structure of materials. FIM works by ionizing gas atoms (usually helium or neon) near a sharp, positively charged tip, causing them to be repelled and form an image on a detector.
