How is Residual Stress Measured in Nanotechnology?
Measuring residual stress in nanoscale materials presents unique challenges due to their small size. Common techniques include:
1. X-ray Diffraction (XRD): This method is widely used to measure stress by analyzing the diffraction patterns of X-rays scattered by the material. 2. Raman Spectroscopy: Changes in the Raman spectra can indicate stress levels in materials like graphene and carbon nanotubes. 3. Electron Microscopy: Techniques such as transmission electron microscopy (TEM) can provide insights into stress distributions at the atomic level.
