Cryogenic Focused Ion Beam Scanning Electron Microscopy (Cryo-FIB SEM) is an advanced technique that combines focused ion beam (FIB) milling with scanning electron microscopy (SEM) under cryogenic conditions. This method is particularly useful for imaging and manipulating biological samples and other sensitive materials at nanometer resolutions. The cryogenic environment helps in preserving the native state of the samples, preventing damage caused by electron beams and ion milling.
