Cryo-FIB SEM operates by first rapidly freezing the sample, usually through a process known as vitrification. The vitrified sample is then transferred to the FIB SEM instrument, where it is kept at cryogenic temperatures (typically below -150°C). The focused ion beam is used to mill or cut the sample at nanoscale precision, while the SEM provides high-resolution imaging. This dual capability allows for detailed structural analysis and precise nanofabrication.
