Conductive Atomic Force Microscopy (C-AFM) is a specialized mode of Atomic Force Microscopy (AFM) that measures the electrical properties of materials at the nanoscale. It combines the high-resolution imaging capabilities of AFM with the ability to measure local electrical conductivity. This technique is particularly useful in the field of nanotechnology for characterizing a wide variety of materials, including semiconductors, polymers, and nanocomposites.
