Automated Crystal Orientation Mapping (ACOM) is a sophisticated technique used to determine the crystallographic orientations of grains in a polycrystalline material. This method utilizes advanced tools, such as Electron Backscatter Diffraction (EBSD) or Transmission Electron Microscopy (TEM), to analyze the orientation and texture of crystals at the nanoscale. ACOM is crucial for understanding the properties and behaviors of materials, especially as they scale down to the nanometer range.
