AFM stands for Atomic Force Microscopy. It is a type of Scanning Probe Microscopy that measures the forces between a sharp probe and the surface of a sample. The probe is mounted on a cantilever, and as it scans the surface, it deflects in response to forces such as van der Waals forces, electrostatic forces, and mechanical contact. These deflections are measured, and a topographical map of the surface is constructed.
