There are several types of SPM techniques, each catering to different aspects of analysis:
1. Atomic Force Microscopy (AFM): Measures surface topography and can operate in various modes like contact, non-contact, and tapping. 2. Scanning Tunneling Microscopy (STM): Primarily used for conductive surfaces and provides atomic resolution images. 3. Magnetic Force Microscopy (MFM): Specialized for mapping magnetic properties of surfaces. 4. Kelvin Probe Force Microscopy (KPFM): Measures surface potential and work function variations.
