Several advanced techniques are used to study interstitials in nanomaterials. Transmission Electron Microscopy (TEM) allows for direct observation of interstitials and their distribution. X-ray Diffraction (XRD) can be employed to detect changes in lattice parameters due to interstitials. Atom Probe Tomography (APT) provides a 3D reconstruction at atomic resolution, making it possible to visualize interstitials in detail.
